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Volumn 346, Issue 1, 1999, Pages 138-144

Cobalt oxide films grown by a dipping sol-gel process

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COBALT COMPOUNDS; FILM GROWTH; FILM PREPARATION; OXIDES; REFRACTIVE INDEX; SOL-GELS; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

EID: 0033148431     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01503-X     Document Type: Article
Times cited : (46)

References (19)
  • 12
    • 0009460292 scopus 로고
    • Serie Amarilla, CINVESTAV del I.P.N., Departamento de Ingeniería Eléctrica
    • A. Avila, Reporte Interno No. 101, Serie Amarilla, CINVESTAV del I.P.N., Departamento de Ingeniería Eléctrica, (1990).
    • (1990) Reporte Interno No. 101
    • Avila, A.1
  • 13
    • 0003432883 scopus 로고
    • Polycrystalline and Amorphous Thin Films and Devices
    • L.L. Kasmersky (Ed.), Academic Press, New York
    • A.H. Clark, Polycrystalline and Amorphous Thin Films and Devices, in: L.L. Kasmersky (Ed.), Materials Science Series, Academic Press, New York, 1980.
    • (1980) Materials Science Series
    • Clark, A.H.1
  • 17
    • 85031632676 scopus 로고    scopus 로고
    • Digital Instruments, Nanoscope III, Owner's manual
    • Digital Instruments, Nanoscope III, Owner's manual.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.