Simpler method for life-testing laser diodes

Microelectronics Reliability

Volumn 39, Issue 6-7, 1999, Pages 1067-1071

  Vanzi, M ^a   Martines, G ^a   Bonfiglio, A ^a   Licheri, M ^a   D'Arco, R ^a   Salmini, G ^b   De Palo, R ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b Pirelli Labs SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIFFERENTIAL EQUATIONS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; EXTRAPOLATION; PHOTODIODES; RELIABILITY;

CURRENT DRIVEN MEASUREMENT; LIFE TESTING; THRESHOLD CURRENT;

SEMICONDUCTOR LASERS;

EID: 0033145344     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00148-1     Document Type: Article

References (2)

1. A. Bonfiglio, M.B. Casu, F. Magistrali, R. De Palo, G. Salmini and M. Vanzi: "Early signatures for REDR-based laser degradations". Microelectronics Reliability 38 (1998) 1215-1220.
2. A. Bonfiglio, M. Vanzi, M.B. Casu, F. Magistrali, M. Maini, G. Salmini: "Interpretation of sudden failures in pump laser diodes" Proc.23rd International Symposium for Testing and Failure Analysis ISTFA/97, Santa Clara, California, Ottobre 1997, pp. 189-194.