Determination of effects of purity and atmospheric gases on electrical properties of perylene thin films by field effect measurement

Synthetic Metals

Volumn 102, Issue 1-3, 1999, Pages 1050-1051

  Suga, T ^a   Iizuka, M ^a   Kuniyoshi, S ^a   Kudo, K ^a   Tanaka, K ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC CONDUCTIVITY; ELECTRIC VARIABLES MEASUREMENT; FIELD EFFECT TRANSISTORS; MORPHOLOGY; ORGANIC POLYMERS; OXYGEN; SEMICONDUCTOR DEVICE STRUCTURES;

CRYSTALLINITY; IN-SITU FIELD EFFECT MEASUREMENT; PERYLENE THIN FILMS; PURITY EFFECT; THIN FILM FIELD EFFECT TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 0033137883     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01295-8     Document Type: Article

References (2)

1. K. Kudo T. Sumimoto K. Hiraga S. Kuniyoshi K. Tanaka JpnJ.Appl.Phys. 36 1997 6994
2. J.G. Laquindanum H.E. Katz A. Dodabalapur AJ. Lovinger J.Am.Chem., Soc. 118 1996 11331