Imaging of electrical features in organic thin films by scanning Maxwell-stress microscopy

Synthetic Metals

Volumn 102, Issue 1-3, 1999, Pages 1579-1580

  Shin, H K ^a,b,c   Inoue, T ^a   Kwon, Y S ^c   Yokoyama, H ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b Fukuoka Industry Science and Technology Foundation   (Japan)

^c Dong A University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY OF SOLIDS; LANGMUIR BLODGETT FILMS; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; PERMITTIVITY; THIN FILMS;

ION COMPLEX; ORGANIC THIN FILMS; SCANNING MAXWELL STRESS MICROSCOPY; SURFACE CHARGE; SURFACE POTENTIAL;

ORGANIC CONDUCTORS;

EID: 0033137671     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)00876-5     Document Type: Article

References (10)

1. P.K. Hansma, V.B. Elings, O. Marti, C.E. Bracker, Science 242 (1988) 209; A.L. Weisenhorn, M, Egger, F. Ohnesorge, S.A.C. Gould, S.-P. Hyen, H.G. Hansma, R.L, Sinsheimer, H.E. Gaub, P.K. Hansma, Langmuir 7 (1991) 8.
2. P.K. Hansma, V.B. Elings, O. Marti, C.E. Bracker, Science 242 (1988) 209; A.L. Weisenhorn, M, Egger, F. Ohnesorge, S.A.C. Gould, S.-P. Hyen, H.G. Hansma, R.L, Sinsheimer, H.E. Gaub, P.K. Hansma, Langmuir 7 (1991) 8.
3. D.K. Schwartz, R. Viswanathan and J.A.N. Zasadzinski, Phys. Rev. Lett. 70 (1993) 1267.
4. H. Yokoyama, T. Inoue, Thin Solid Film 242 (1994) 33.
5. H. Yokoyama, M.J. Jeffery, T. Inoue, Jpn. J. Appl. Phys. 32 (1993) L1845.
6. H. Yokoyama, T. Inoue and J. Itoh, Appl. Phys. Lett. 65 (1994) 3143.
7. G.G. Roberts, in: Langmuir-Blodgett Films, Ed. G.G. Roberts (Plenum, New York, 1990) p. 137.
8. T. Inoue, H. Yokoyama, Thin Solid Film 243 (1994) 399.
9. J. Fang, C.M. Knobler and H. Yokoyama, Physica A 244 (1997) 91; J. Fang, M. Dennin, C.M. Knobler, Yu.K. Godovsky, N.N. Makarova and H. Yokoyama, J. Phys. Chem. B 101 (1997) 3147.
10. J. Fang, C.M. Knobler and H. Yokoyama, Physica A 244 (1997) 91; J. Fang, M. Dennin, C.M. Knobler, Yu.K. Godovsky, N.N. Makarova and H. Yokoyama, J. Phys. Chem. B 101 (1997) 3147.