Surface cleaning efficiency measurements for UHV applications

Vacuum

Volumn 53, Issue 1-2, 1999, Pages 317-320

  Benvenuti, C ^a   Canil, G ^a   Chiggiato, P ^a   Collin, P ^a   Cosso, R ^a   Guerin J ^a   Ilie, S ^a   Latorre, D ^a   Neil, K S ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARGED PARTICLES; PARTICLE ACCELERATORS; PHOTONS; RADIOACTIVE TRACERS; VACUUM APPLICATIONS;

PHOTON BOMBARDMENT; ULTRAHIGH VACUUM;

SURFACE CLEANING;

EID: 0033132681     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00364-9     Document Type: Article

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