The removal of the smear layer using the Quantec system. A study using the scanning electron microscope

International Endodontic Journal

Volumn 32, Issue 3, 1999, Pages 217-224

  Bertrand, M F ^a   Pizzardini, P ^a   Muller, M ^a   Medioni E ^a   Rocca, J P ^a  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

Endodontics; Nickel titanium; Smear layer

Indexed keywords

NICKEL; TITANIUM; TITANIUM NICKELIDE;

ARTICLE; COMPARATIVE STUDY; DENTAL EQUIPMENT; DENTAL SURGERY; ENDODONTICS; HUMAN; INSTRUMENTATION; MOLAR TOOTH; NONPARAMETRIC TEST; SCANNING ELECTRON MICROSCOPY;

DENTAL HIGH-SPEED TECHNIQUE; DENTAL INSTRUMENTS; HUMANS; MICROSCOPY, ELECTRON, SCANNING; MOLAR; NICKEL; ROOT CANAL PREPARATION; SMEAR LAYER; STATISTICS, NONPARAMETRIC; TITANIUM;

EID: 0033129547     PISSN: 01432885     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2591.1999.00231.x     Document Type: Article

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