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Volumn 20, Issue 5, 1999, Pages 358-364
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Measurement and study on thermal characteristics of semiconductor devices by electrical method
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC VARIABLES MEASUREMENT;
MESFET DEVICES;
TEMPERATURE DISTRIBUTION;
TRANSIENT THERMAL RESPONSE;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0033123803
PISSN: 02534177
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (24)
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References (8)
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