Finite element analysis of a moving magnetic flux type sensor developed for non-destructive testing

IEEE Transactions on Magnetics

Volumn 35, Issue 3 PART 1, 1999, Pages 1853-1856

  Enokizono, Masato ^a   Todaka, Takashi ^a   Tuchida, Yuji ^a   Hachiki, Nobuhiko ^a  

^a OITA UNIVERSITY   (Japan)

Author keywords

Eddy current testing; Finite element method; Moving magnetic field; Shading coil

Indexed keywords

CRACKS; CURRENT DENSITY; DEFECTS; DIFFERENTIAL EQUATIONS; EDDY CURRENT TESTING; ELECTRIC COILS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; MAGNETIC FIELDS; MAGNETIC FLUX;

EDGE ELEMENT METHOD; MAGNETIC FIELD ANALYSIS; MAGNETIC FLUX TYPE SENSOR; MAGNETIC RELUCTIVITY; REVERSE SIDE DEFECTS; SHADING COIL;

SENSORS;

EID: 0033121673     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.767394     Document Type: Article

References (5)

1. M.Hashimoto and Polytechnic University "Theory of Eddy Current Testing/Proceeding of the Sixth MAGDA Conference in Shinsyu p.84, 1997.
2. Y. Tuchida, T. Okamoto and M. Enokizono, "A Moving Magnetic Flux Type Sensor with shading coils for Eddy Current Testing", Jounal of Magnetism and magnetic materials, in press.
3. H. Tsuboi, H. Kobayashi, T. Misaki, K. Yano, "2-D Finite Element Method by Using Edge Element", The Forth MAGDA Conference in Tottori, A1-4, 1995.
4. |4] A. Kameari, "Three Dimensional Eddy Current calculation using Edge Elements for Magnetic Vector Potential", Applied Electromagnetics in Materials, Ed. K. Miya, Pergamon Press, p. 225, 1989.
5. [5| Y.Tuchida, T.Chady and M.Enokizono, "Development of a Moving Magnetic Flux Type Sensor using Shading Coils for ECT", IEEE Trans, on Magn., Vol. 34, No. 4, p.1309-1311, 1998.