Near field optical behaviour of C supertips

Ultramicroscopy

Volumn 76, Issue 4, 1999, Pages 187-194

  Castagne M ^a   Benfedda, M ^a   Lahimer, S ^a   Falgayrettes, P ^a   Fillard, J P ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

AFM; Optical near field; PSTM; Supertips

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; DIAMONDS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

ELECTRON BEAM INDUCED DEPOSITION (EBID); PHOTON SCANNING TUNNELING MICROSCOPY (PSTM); SUPERTIPS;

CRYSTAL GROWTH;

ARTICLE; ATOMIC FORCE MICROSCOPY; OPTICAL RESOLUTION; OPTICS; PHOTON; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR;

EID: 0033118797     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00075-8     Document Type: Article

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