Visual inspection system for the classification of solder joints

Pattern Recognition

Volumn 32, Issue 4, 1999, Pages 565-575

  Tae Hyeon, Kim ^a   Tai Hoon, Cho ^b   Moon, Young Shik ^a   Park, Sung Han ^a  

^a Hanyang University   (South Korea)

^b Korea University of Technology and Education   (South Korea)

Author keywords

3D sensing; Bayes classifier; Classification; Feature; Industrial inspection; Machine vision; Neural network

Indexed keywords

ALGAE; BACKPROPAGATION; COMPUTATIONAL COMPLEXITY; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE QUALITY; INSPECTION; LIGHT EMITTING DIODES; NEURAL NETWORKS; QUALITY CONTROL; SOLDERED JOINTS;

BAYES CLASSIFIERS; THREE-DIMENSIONAL SENSING;

COMPUTER VISION;

EID: 0033116105     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0031-3203(98)00103-4     Document Type: Article

References (11)

1. S.L. Bartlet, P.J. Besl, C.L. Cole, R. Jain, D. Mukherjee, K.D. Skifstad, Automatic solder joint inspection, IEEE Trans. PAMI 10 (1), (1988) 31-41.
2. D.W. Capson, S.K. Eng, A tiered-color illumination approach for machine inspection of solder joints, IEEE Trans. PAMI 10 (3) (1988) 387-393.
3. J.S. Park, A reflectance model-based approach to highlight separation and surface description for inspection of 3-dimensional specular objects, Ph.D. Thesis, University of Florida, 1991.
4. S. Kobayashi, Y. Tanimura, T. Yotsuya, Apparatus for inspecting printed circuit boards and the like, and method of operating same, United States Patent No. 5, 245, 671, 1993.
5. A.C. Sanderson, L.E. Weiss, S.K. Nayar, Structured highlight inspection of specular surfaces, IEEE Trans. PAMI 10 (1) (1988) 44-45.
6. S. Hata, M. Nishiyama, Shape detection of small specular surface using multiple images under color stripe lighting, ISMCR'93 Session A, III-19, 1993.
7. N. Otsu, A threshold selection method from gray-level histograms, IEEE Trans. SMC SMC-9 (1979) 62-66.
8. S.K. Nayar, K. Ikeuchi, T. Kanade, Surface reflection: physical and geometrical perspectives, IEEE Trans. PAMI 13 (7) (1991) 611-634.
9. E.J. Jung, I.D. Yun, S.U. Lee, Recovery of 3-D shape using hybrid reflectance model, ICIP-94, 2, (1994) 120-124.
10. L. Fausett, Fundamentals of Neural Networks. Prentice-Hall, Englewood, Cliffs, NJ, 1994.
11. J.T. Tou, R.C. Gonzalez, Pattern Recognition Principles. Addison-Wesley, Reading, MA, 1974.