The dynamic response of a hot-wire anemometer: III. Voltage-perturbation versus velocity-perturbation testing for near-wall hot-wire/film probes

Measurement Science and Technology

Volumn 10, Issue 3, 1999, Pages 152-169

  Khoo, B C ^a   Chew, Y T ^a   Teo, C J ^a   Lim, C P ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Dynamic response; Flush mounted hot wire; Hot film wall shear stress gauge; Near wall hot wire; Square wave test

Indexed keywords

ELECTRIC POTENTIAL; FREQUENCY RESPONSE; GAGES; INSTRUMENT TESTING; PROBES; SHEAR STRESS; THERMAL EFFECTS;

HOT FILM PROBES; HOT WIRE ANEMOMETERS; HOT WIRE PROBES; VELOCITY PERTURBATION TESTS; VOLTAGE PERTURBATION TESTS;

ANEMOMETERS;

DYNAMIC RESPONSE; HOT WIRE ANEMOMETER;

EID: 0033104530     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/3/009     Document Type: Article

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