Trying versus succeeding: Event-related designs dissociate memory processes

Neuron

Volumn 22, Issue 3, 1999, Pages 412-414

  Donaldson, David I ^a   Buckner, Randy L ^a  

^a WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EVENT RELATED POTENTIAL; MEMORY; MEMORY CONSOLIDATION; POSITRON EMISSION TOMOGRAPHY; PRIORITY JOURNAL; RECALL; RECOGNITION; SHORT SURVEY;

EID: 0033103162     PISSN: 08966273     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0896-6273(00)80693-5     Document Type: Note

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