Test sequencing problems arising in test planning and design for testability

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.

Volumn 29, Issue 2, 1999, Pages 153-163

  Raghavan, Vijaya ^a,b   Shakeri, Mojdeh ^a,b   Pattipati, Krishna R ^a,c  

^a IEEE   (United States)

^b MATHWORKS INC   (United States)

^c UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

AND OR graph search; Heuristics; Minimal storage testing; Minimax test sequencing; Multi objective optimization; Test planning

Indexed keywords

ALGORITHMS; GRAPH THEORY; HEURISTIC METHODS; OPTIMIZATION; PROBABILITY DISTRIBUTIONS;

TEST SEQUENCING PROBLEMS;

DESIGN FOR TESTABILITY;

EID: 0033101906     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/3468.747850     Document Type: Article

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