Reverse engineering: High speed digitization of free-form surfaces by phase-shifting grating projection moiré topography

International Journal of Machine Tools and Manufacture

Volumn 39, Issue 3, 1999, Pages 389-401

  Kim, Seung Woo ^a   Choi, Yi Bae ^a   Oh, Jung Taek ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Free form surfaces; Non contact profile measurement; Projection moir topography; Reverse engineering; Three dimensional digitization

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; DIFFRACTION GRATINGS; IMAGE ANALYSIS; IMAGE QUALITY; MOIRE FRINGES; OBJECT RECOGNITION;

FREE-FORM SURFACES; NON-CONTACT PROFILE MEASUREMENTS; PROJECTION MOIRE TOPOGRAPHY; THREE-DIMENSIONAL DIGITIZATION;

REVERSE ENGINEERING;

EID: 0033101775     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(98)00037-6     Document Type: Article

References (8)

1. Song C.K., Kim S.W. Reverse engineering: Autonomous digitization of free-formed surfaces on a CNC coordinate measuring machine. Int. J. Mach. Tools Manufact. 37(7):1997;1041.
2. Meng C.H., Yau H.T., Lai G.Y. Automated precision measurement of surface profile in CAD-directed inspection. IEEE Trans. Robot Automn. 8(2):1992;268.
3. Y. Sato, H.K. Itagama, H. Fujita, Shape measurement of curved objects using multiple slit-ray projection. IEEE Trans. On Pat. Anal. And Mach. 1982 Intel. PAMI-4, p. 641.
4. Besl P.J. Active optical range imaging sensors. Machine Vision and Applications. 1:1988;127.
5. Srinivasan V., Liu H.C., Halioua M. Automated phase measuring profilometry: a phase mapping approach. Applied Optics. 24(2):1985;185.
6. Idesawa M., Yatagai T., Soma T. Scanning moire method and automatic measurement of 3-D shapes. Applied Optics. 16(8):1977;2152.
7. K. Creath, Phase-measurement interferometry techniques, Chapter 5, Elsevier Science Publishers, 1988.
8. Halioua M., Krishnamurthy R.S., Liu H., Chiang F.P. Projection moiré with moving grating for automated 3-D topography. Applied Optics. 22(6):1983;850.