Growth, structure and properties of ultra-thin copper films on a V(110) surface

Surface Science

Volumn 423, Issue 1, 1999, Pages 24-31

  Kralj, M ^a   Pervan, P ^a   Milun, M ^a  

^a INSTITUTE OF PHYSICS   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BINDING ENERGY; COPPER; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; ELECTRONIC PROPERTIES; FILM GROWTH; SEGREGATION (METALLOGRAPHY); SINGLE CRYSTALS; THERMAL EFFECTS; ULTRATHIN FILMS; VANADIUM;

BODY CENTERED CUBIC (BCC) STRUCTURE;

METALLIC FILMS;

EID: 0033100874     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00885-1     Document Type: Article

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