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Volumn 68, Issue 2-3, 1999, Pages 633-636
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Optical determination of interface roughness in multilayered semiconductor structures
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Author keywords
[No Author keywords available]
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Indexed keywords
LIGHT REFLECTION;
LIGHT TRANSMISSION;
MATHEMATICAL MODELS;
OPTICAL MATERIALS;
REFRACTIVE INDEX;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR QUANTUM WELLS;
SURFACE ROUGHNESS;
INTERFACE ROUGHNESS;
MULTILAYERS;
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EID: 0033100633
PISSN: 09462171
EISSN: None
Source Type: Journal
DOI: 10.1007/s003400050677 Document Type: Article |
Times cited : (6)
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References (21)
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