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Volumn 68, Issue 2-3, 1999, Pages 633-636

Optical determination of interface roughness in multilayered semiconductor structures

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; OPTICAL MATERIALS; REFRACTIVE INDEX; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SURFACE ROUGHNESS;

EID: 0033100633     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003400050677     Document Type: Article
Times cited : (6)

References (21)
  • 9
    • 0347229462 scopus 로고    scopus 로고
    • ed. by G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec San Francisco Press, San Francisco
    • Z. Liliental-Weber, M. Li, G.S. Li, C. Chang-Hasnain, E.R. Weber: Proc. Microsc. Microanal., ed. by G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec (San Francisco Press, San Francisco 1996) p. 942
    • (1996) Proc. Microsc. Microanal. , pp. 942
    • Liliental-Weber, Z.1    Li, M.2    Li, G.S.3    Chang-Hasnain, C.4    Weber, E.R.5
  • 17
    • 0001288029 scopus 로고    scopus 로고
    • Translated
    • A.V. Andreev, J.R. Prudnikov: Cryst. Rep. 41, 203 (1996) Translated from Kristallografyia 41, 220 (1996)
    • (1996) Kristallografyia , vol.41 , pp. 220


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.