Neutron imaging of bulk polycrystalline materials

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 423, Issue 2-3, 1999, Pages 428-434

  Wroblewski, T ^a   Jansen, E ^a   Schafer W ^a   Skowronek, R ^b  

^a DESY   (Germany)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

61.12.q; 61.72.Ff; Imaging; Neutron diffraction

Indexed keywords

ALUMINUM ALLOYS; NEUTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS;

NEUTRON IMAGING;

NEUTRON RADIOGRAPHY;

EID: 0033100315     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01418-1     Document Type: Article

References (13)

1. Wroblewski T., Geier S., Hessmer R., Schreck M., Rauschenbach B. Rev. Sci. Instrum. 66:1995;3560.
2. Proc. 5th Int. Conf. on Synchrotron Radiation Instrumentation, Stony Brook, 1994, published in Rev. Sci. Instrum. 66(2) February 1995.
3. Proc. 5th Int. Conf. on Synchrotron Radiation Instrumentation, Stony Brook, 1994, published in Rev. Sci. Instrum. 66(2) February 1995.
4. T. Wroblewski, X-Ray Imaging of Polycrystalline and Amorphous Materials/ Advances in X-ray Analysis, Vol. 40 published on CD-ROM, 1998.
5. Poulsen H.F., Garbe S., Lorentzen T., Juul Jensen D., Poulsen F.W., Andersen N.H., Frello T., Feidenhans'l R., Graafsma H. J. Synchrotron Rad. 4:1997;147.
6. Rütt U., Diederichs A., Schneider J.R., Shirane G. Europhys. Lett. 39:1997;395.
7. Bouchard R., Hupfeld D., Lippmann T., Neuefeind J., Poulsen H.F., Rütt U., Schmidt T., Schneider J.R., Süssenbach J., von Zimmermann M. J. Synchrotron Rad. 5:1998;90.
8. Wroblewski T., Breuer D., Crostack H.-A., Fandrich F., Gross M., Klimanek P. Mat. Sci. Forum. 278-281:1998;216.
9. Kurz R., Reinartz R., Widdau S., Schelten J., Scholz A., Schäfer W. Nuclear Instrum. Meth. A. 273:1988;273.
10. T. Wroblewski, O. Clauβ, H.-A. Crostack, F. Fandrich, Ch. Genzel, K. Hradil, W. Ternes, E. Woldt, A new Diffractometer for Materials Science and Imaging at HASYLAB Beamline G3, Nucl. Instr. Meth. A, in press.
11. Schäfer W., Jansen E., Skowronek R., Kirfel A. Physica B. 234-236:1997;1146.
12. Alker A., Jansen E., Schäfer W., Kirfel A., Seitz D., Grönefeld M. Mat. Sci. Forum. 278-281:1998;514.
13. T. Wroblewski, E. Woldt, Non ambient μ-diffraction, Proc. 47th Denver X-ray Conf., Colorado Springs, vol. 42, 1998 Adv. X-ray Anal., to be published.