Scanning tunneling microscopy for metal deposition studies

Electrochemical Society Interface

Volumn 8, Issue 1, 1999, Pages 26-30

  Kolb, D M ^a   Schneeweiss, M A ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACE TOPOGRAPHY; SURFACE TREATMENT;

BODY CENTERED CUBIC (BCC) STRUCTURE; FACE CENTERED CUBIC (FCC) STRUCTURE; SURFACE X RAY DIFFRACTION ANALYSIS (SXRD);

ELECTRODEPOSITION;

EID: 0033099127     PISSN: 10648208     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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