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Volumn 18, Issue 5, 1999, Pages 415-417

X-ray photoelectron spectroscopy of sputter-deposited fluorocarbon films

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; ELECTRIC DISCHARGES; ETCHING; MOLECULAR STRUCTURE; PLASMA POLYMERIZATION; PYROLYSIS; SPUTTER DEPOSITION; TEMPERATURE; THICKNESS MEASUREMENT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033099063     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006661507638     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.