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Volumn 18, Issue 5, 1999, Pages 415-417
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X-ray photoelectron spectroscopy of sputter-deposited fluorocarbon films
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COMPOSITION;
ELECTRIC DISCHARGES;
ETCHING;
MOLECULAR STRUCTURE;
PLASMA POLYMERIZATION;
PYROLYSIS;
SPUTTER DEPOSITION;
TEMPERATURE;
THICKNESS MEASUREMENT;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
LASER BEAM PROBE;
SPUTTER CLEANING;
FLUOROCARBONS;
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EID: 0033099063
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1006661507638 Document Type: Article |
Times cited : (5)
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References (11)
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