Correlation between electric force microscopy and scanning electron microscopy for the characterization of percolative conduction in electronic devices

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 79, Issue 3, 1999, Pages 517-526

  Alessandrini, A ^a   Valdre G ^a   Morten, B ^b   Piccinini, S ^b   Prudenziati, M ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE MATERIALS; ELECTRIC CURRENTS; ELECTRIC INSULATING MATERIALS; ELECTRON TRANSPORT PROPERTIES; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); RESISTORS; RUTHENIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; THICK FILM DEVICES;

ELECTRIC FORCE MICROSCOPY (EFM); RUTHENIUM OXIDE; THICK FILM RESISTORS;

PERCOLATION (SOLID STATE);

EID: 0033099038     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819908206424     Document Type: Article

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