Decay and dephasing of image-potential states due to surface defects and disorder

Applied Physics B: Lasers and Optics

Volumn 68, Issue 3, 1999, Pages 377-381

  Weinelt, M ^a   Reuss, Ch ^a   Kutschera, M ^a   Thomann, U ^a   Shumay, I L ^a   Fauster, Th ^a   Hoefer, U ^a   Theilmann, F ^a   Goldmann, A ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTONS;

DECAY RATE MEASUREMENT; DEPHASING; IMAGE-POTENTIAL STATES; LINEWIDTH MEASUREMENT; QUANTUM-BEAT SPECTROSCOPY;

ELECTRON ENERGY LEVELS;

EID: 0033098888     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003400050635     Document Type: Article

References (19)