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Volumn 14, Issue 3, 1999, Pages 990-994

Ultraviolet laser-induced formation of thin silicon oxide film from the precursor β-chloroethyl silsesquioxane

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; DEPOSITION; LASER PULSES; OXIDES; QUARTZ; REFRACTIVE INDEX; SILICON; SILICON COMPOUNDS; SODIUM CHLORIDE; THIN FILMS; ULTRAVIOLET RADIATION;

EID: 0033098783     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0132     Document Type: Article
Times cited : (10)

References (14)
  • 9
    • 85034118820 scopus 로고    scopus 로고
    • Ph.D. Dissertation, University of Pennsylvania
    • (a) L.K. Figge, Ph.D. Dissertation, University of Pennsylvania (1996);
    • (1996)
    • Figge, L.K.1
  • 11
    • 0041694112 scopus 로고
    • A Fortran Program for Analysis of Ellipsometer Measurements
    • F.L. McCrackin, A Fortran Program for Analysis of Ellipsometer Measurements (Natl. Bur. Stand. Tech. Note 479, 1969).
    • (1969) Natl. Bur. Stand. Tech. Note , vol.479
    • McCrackin, F.L.1
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.