Error-rate equations for the general biometric system

IEEE Robotics and Automation Magazine

Volumn 6, Issue 1, 1999, Pages 35-48

  Wayman, James L ^a  

^a SAN JOSE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ERROR ANALYSIS; FUNCTIONS; PATTERN MATCHING; PROBABILITY DISTRIBUTIONS;

BIN-ERROR RATE; BIOMETRIC IDENTIFICATION SYSTEM;

PATTERN RECOGNITION SYSTEMS;

EID: 0033098544     PISSN: 10709932     EISSN: None     Source Type: Journal    
DOI: 10.1109/100.755813     Document Type: Article

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