Thermal modeling and experimentation to determine maximum power capability of SCR's and thyristors

IEEE Transactions on Power Electronics

Volumn 14, Issue 2, 1999, Pages 316-322

  Walker, William D ^a,b   Weldon, William F ^a,c  

^a IEEE   (United States)

^b FORD MOTOR COMPANY   (United States)

^c UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Cryogenic; Junction temperature; Pulsed power; SCR; Thermal model; Thyristor

Indexed keywords

COMPUTATIONAL METHODS; CORRELATION METHODS; CRYOGENICS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; ITERATIVE METHODS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR JUNCTIONS; SOLID STATE RECTIFIERS;

PULSED POWER; THERMAL MODELS;

THYRISTORS;

EID: 0033097511     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/63.750185     Document Type: Article

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