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Volumn 68, Issue 2-3, 1999, Pages 343-347

Coherence artifacts in second harmonic microscopy

Author keywords

[No Author keywords available]

Indexed keywords

DISTORTION (WAVES); INTERFACES (MATERIALS); LIGHT INTERFERENCE; MORPHOLOGY; SECOND HARMONIC GENERATION;

EID: 0033097415     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003400050629     Document Type: Article
Times cited : (14)

References (23)
  • 15
    • 0000336325 scopus 로고
    • ed. by H. Ponath, G. Stegeman Elsevier Science, Amsterdam
    • T.F. Heinz: In Nonlinear surface electromagnetic phenomena, ed. by H. Ponath, G. Stegeman (Elsevier Science, Amsterdam 1991) pp. 353-417; G.A. Reider, T.F. Heinz: In Electromagnetic waves: recent developments in research, Vol. 2, ed. by P. Halevi (Elsevier Science, Amsterdam 1995) pp. 413-478
    • (1991) Nonlinear Surface Electromagnetic Phenomena , pp. 353-417
    • Heinz, T.F.1
  • 16
    • 0002219120 scopus 로고
    • ed. by P. Halevi Elsevier Science, Amsterdam
    • T.F. Heinz: In Nonlinear surface electromagnetic phenomena, ed. by H. Ponath, G. Stegeman (Elsevier Science, Amsterdam 1991) pp. 353- 417; G.A. Reider, T.F. Heinz: In Electromagnetic waves: recent developments in research, Vol. 2, ed. by P. Halevi (Elsevier Science, Amsterdam 1995) pp. 413-478
    • (1995) Electromagnetic Waves: Recent Developments in Research , vol.2 , pp. 413-478
    • Reider, G.A.1    Heinz, T.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.