High-temperature X-ray diffraction and dilatometric studies on some oxygen ion conducting compounds

Journal of Materials Science Letters

Volumn 18, Issue 5, 1999, Pages 355-357

  Achary, S N ^a   Mathews, M D ^a   Patwe, S J ^a   Tyagi, A K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; CRYSTAL STRUCTURE; DIFFERENTIAL THERMAL ANALYSIS; DILATOMETERS; IONIC CONDUCTION; LATTICE CONSTANTS; PHASE TRANSITIONS; STOICHIOMETRY; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

DILATOMETRY; HIGH TEMPERATURE X RAY DIFFRACTION;

OXIDES;

EID: 0033097085     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006664113573     Document Type: Article

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