Effect of material parameters on the quantum efficiency of GaInAsSb detectors

Solid-State Electronics

Volumn 43, Issue 3, 1999, Pages 625-631

  Tian, Yuan ^a   Zhou, Tianming ^a   Zhang, Baolin ^a   Jiang, Hong ^a   Jin, Yixin ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTATIONAL METHODS; GALLIUM ALLOYS; LIGHT ABSORPTION; PARAMETER ESTIMATION; QUANTUM EFFICIENCY;

INFRARED PHOTOVOLTAIC DETECTORS;

PHOTODETECTORS;

EID: 0033097083     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00294-9     Document Type: Article

References (21)

1. Benoit J, Boulou M, Soulage G, Joullie A, Mani H. J Opt Commum 1988;9(2):55-8.
2. Aardvark A, Allogho GG, Bougnot G, David JPR, Giani A, Haywood SK, Hill G, Klipstein PC, Mansoor F, Mason NJ, Nicholas RJ, Pascal-Delannoy F, Pate M, Ponnampalam L, Walker PJ. Semicond Sci Technol 1993;8(1S):S380.
3. Srivastava AK, Dewinter JC, Caneau C, Pollack MA, Zyskind JL. Appl Phys Lett 1986;48(14):903.
4. Zhang B, Zhou T, Jiang H, Ning Y, Jin Y. Electron Lett 1995;31:830.
5. Zhang B, Jin Y, Zhou T, Jiang H, Ning Y, Li S. Mar Res Soc Symp Proc 1996;415:31.
6. Choi HK, Eglash SJ. Appl Phys Lett 1991;59:1165.
7. Willardson RK. Semicoductors and semimetals, vol. 18. . New York, 1981. p. 236.
8. Rogalski A, Rutkowski J. Infrared Phys 1982;22:199.
9. Rosenfeld D, Bahir G. J Appl Phys 1992;72:3034.
10. Levy D, Schacham SE, Kidrom I. IEEE Trans Electron Devices 1987;34:2059.
11. Levy D, Schacham SE, Kidrom I. IEDM Tech Dig 1986;18:373.
12. Tian Y, Zhou TM, Zhang BL, Jin YX, Ning YQ, Jiang H, Yuan G. Opt Eng 1998;37(6):1754.
13. Willardson RK, Beer AC. Semiconductors and semimetals, vol. 11. Academic Press, 1975. p. 16.
14. Djuric Z, Jaksic Z. Electron Lett 1988;24:1100.
15. Kurata M. Numerical analysis of semiconductor device. Toronto: Lexington, 1982.
16. Van Roosbroeck W. Bell Syst Tech J 1950;29:560.
17. van der Wiele F. In: Jespers PG, van der Wiele J, White MH. Solid state imaging. Noordhoff: Leydon, 1976. p. 47.
18. Willardson RK, Beer AC. Semiconductors and semimetals, vol. 18. Academic Press, 1981. p. 228.
19. Li AZ, Zhong JQ, Zheng YL, Wang JX, Ru GP, Bi WG, Qi M. J Cryst Growth 1995;150:1375.
20. Moss TS, Burrell GJ, Ellis B. Semiconductor opto-electronics. Chapel River Press, 1973. p. 48.
21. Mebarki M, Ait-Kaci H, Lazzari JL, Segura-Fouillant C, Joullie A, Llinares C, Salesse I. Solid-State Electron 1996;39(1):39.