Atom probe and transmission electron microscopy investigations of heavily drawn pearlitic steel wire

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 30, Issue 13, 1999, Pages 717-727

  Hong, M H ^a   Reynolds Jr , W T ^b   Tarui, T ^c   Hono, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b State University   (United States)

^c NIPPON STEEL CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE; ATOM PROBE FIELD-ION MICROSCOPIES; CARBON CONCENTRATIONS; DRAWING STRAIN; INTERLAMELLAR SPACING; NANO SCALE; NANOCRYSTALLINES; PEARLITIC STEELS; POLYCRYSTALLINE; PRE-DEFORMATION; SILICON CONCENTRATION; SPHERODIZATION; TEM; TRUE STRAIN;

CONCENTRATION (PROCESS); FERRITE; NANOSTRUCTURED MATERIALS; PEARLITE; PROBES; STEEL; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; WIRE; WIRE DRAWING; AMORPHIZATION; ANNEALING; CARBON; METALLOGRAPHIC MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; SILICON;

CARBIDES; WIRE;

ATOM PROBE FIELD ION MICROSCOPY (APFIM); CEMENTITE;

EID: 0033096792     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-999-1003-y     Document Type: Article

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