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Volumn 224, Issue 1-4, 1999, Pages 97-104
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Temperature dependence of piezoelectric properties for relaxor-ferroelectric solid solutions undergoing a rhombohedral to tetragonal phase transition
a a a
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
LEAD COMPOUNDS;
PHASE DIAGRAMS;
PHASE TRANSITIONS;
PIEZOELECTRICITY;
SINGLE CRYSTALS;
SOLID SOLUTIONS;
TEMPERATURE;
X RAY DIFFRACTION ANALYSIS;
BYER-ROUNDY POLARIZATION MEASUREMENTS;
MORPHOTROPIC PHASE BOUNDARY;
PIEZOELECTRIC COEFFICIENT;
POLING TEMPERATURE;
RELAXOR;
RHOMBOHEDRAL PHASE;
TETRAGONAL PHASE;
FERROELECTRIC MATERIALS;
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EID: 0033086632
PISSN: 00150193
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1080/00150199908210555 Document Type: Article |
Times cited : (12)
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References (9)
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