Soft recovery of power diodes by means of field controlled injection

Solid-State Electronics

Volumn 43, Issue 2, 1999, Pages 245-254

  Kaschani, K T ^a   Sittig, R ^b  

^a SIEMENS AG   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC COMMUTATION; IMPACT IONIZATION; SWITCHING;

FIELD CONTROLLED INJECTION;

DIODES;

EID: 0033080212     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00263-9     Document Type: Article

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