Alpha-particle-induced collected charge model in SOI-DRAM's

IEEE Transactions on Electron Devices

Volumn 46, Issue 2, 1999, Pages 388-395

  Satoh, Shigeo ^a   Tosaka, Yoshiharu ^a   Suzuki, Kunihiro ^a   Itakura, Toru ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; CAPACITANCE; GATES (TRANSISTOR); INDUCED CURRENTS; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY;

ALPHA PARTICLE INDUCED COLLECTED CHARGE MODELS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0033079546     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.740907     Document Type: Article

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