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Volumn 155, Issue 2, 1999, Pages 35-37
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Atomic force microscopy of metallic surfaces
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFECTS;
FRACTURE MECHANICS;
METALLOGRAPHIC MICROSTRUCTURE;
NANOTECHNOLOGY;
PLASTIC DEFORMATION;
SURFACE ROUGHNESS;
NANOINDENTATION;
MATERIALS SCIENCE;
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EID: 0033079451
PISSN: 08827958
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (0)
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