Effects of misfit dislocation interaction and 90°-type misfit dislocations on strain relaxation behavior in strained epilayer

Solid-State Electronics

Volumn 43, Issue 2, 1999, Pages 355-358

  Jin, Z ^a   Yang, S ^a   An, H ^a   Wang, B ^a   Liu, S ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; STRAIN; THIN FILMS;

STRAINED EPILAYERS;

DISLOCATIONS (CRYSTALS);

EID: 0033079394     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00266-4     Document Type: Article

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