Dependence of the surface resistance on the microdefects in YBa2Cu3O7-X films

Journal of Crystal Growth

Volumn 197, Issue 1-2, 1999, Pages 376-378

  Ueno, Yoshiki ^a   Sakakibara, Nobuyoshi ^a   Hoshizaki, Hiroki ^a  

^a Advanced Mobile Telecommunication Technology Inc   (Japan)

Author keywords

Grain boundary; High temperature superconductor; HTS; Stacking fault; Surface resistance; YBCO

Indexed keywords

GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNESIA; OXIDE SUPERCONDUCTORS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; YTTRIUM BARIUM COPPER OXIDES;

DIELECTRIC RESONANT METHOD; FULL-WIDTH AT HALF-MAXIMUM (FWHM); SURFACE RESISTANCE;

SUPERCONDUCTING FILMS;

EID: 0033079344     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00897-5     Document Type: Article

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