Dielectric Properties of Microstructure-Controlled Ba2Ti9O20 Resonators

Journal of the American Ceramic Society

Volumn 82, Issue 2, 1999, Pages 325-330

  Lin, Wen Yi ^a   Speyer, Robert F ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CRYSTAL MICROSTRUCTURE; DENSIFICATION; DIELECTRIC DEVICES; DILATOMETERS; DOPING (ADDITIVES); GRAIN BOUNDARIES; PERMITTIVITY; SINTERING; TIN COMPOUNDS; VAPORIZATION; ZIRCONIA;

TIN OXIDE; TRIPLE-POINT LIQUID-PHASE VOLATILIZATION;

RESONATORS;

EID: 0033079286     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.1999.tb20065.x     Document Type: Article

References (10)

1. 20 Microwave Resonators Doped with Zirconium and Tin Oxides," J. Am. Ceram. Soc., in press.
2. A. J. Moulson and J. M. Herbert. Electroceramics: Materials, Properties, and Applications; p. 244. Chapman and Hall, New York, 1990.
3. G. Agarwal, W. S. Hackenberger, and R. F. Speyer, "Microstiuctural Development of ZnO Using a Rate Controlled Sintering Dilatometer," J. Mater. Res., 11 [3] 671-79 (1996).
4. W. S. Hackenberger and R. F. Speyer, "A Fast-Firing Shrinkage Rate Controlled Dilatometer Using An Infrared Image Furnace." Rev. Sci. Instrum., 65 [3] 701-706 (1994).
5. Powder Diffraction File, Card No. 40-405. International Centre on Diffraction Data, Newtown Square, PA, 1991.
6. 20 via Rapid Thermal Processing," submitted to J. Mater. Res.
7. Y. Kobayashi and M. Katob. "Microwave Measurement of Dielectric Properties of Low-Loss Materials by the Dielectric Rod Resonator Method," IEEE Trans. Microwave Theory Tech., MTT-33 [7] 586-92 (1985).
8. W. S. Hackenberger. The Pennsylvania State University. University Park, PA; private communication, 1996.
9. 4," Am. Ceram. Soc. Bull., 73 [10] 92-95 (1994).
10. 20." J. Mater. Res., 11 [8] 1996-2001 (1996).