Local electrical activity of impact avalanche transit time diodes by the scanning transmission electron-beam- induced current technique

Philosophical Magazine Letters

Volumn 79, Issue 2, 1999, Pages 55-61

  Cabanel, C ^a   Maya, H ^a   Laval, J Y ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; INTERFACES (MATERIALS); TRANSMISSION ELECTRON MICROSCOPY;

SCANNING TRANSMISSION ELECTRON BEAM-INDUCED CURRENT TECHNIQUES;

IMPATT DIODES;

EID: 0033078534     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008399177543     Document Type: Article

References (12)

1. Benabbas, T., Cabanel, C., Laval, J. Y., Pastol, J. L., and Dinh Huynh, N., 1990, Rev. Phys. Appl., 51, C1-439.
2. Brown, P. D., and Humphreys, C. J., 1995, Inst. Phys. Conf. Ser., 147, Section 8, 285.
3. Cabanel, C., and Laval, J. Y., 1989, Rev. Phys. Appl. 24, C6.
4. Cabanel, C., and Laval, J. Y., 1990, J. appl. Phys., 67, 1425.
5. Gulshaw, B., Giblin, R. A., and Blakey, P. A., 1975, Int. J. Electron. 39, 121.
6. Dalle, C., Rolland, P. A., and Lleti, G., 1990, IEEE Trans. Electron. Devices, 37, 1.
7. Duchemin, J. P., 1978, J. Electrochem. Soc., 128, 2187.
8. Fathy, D., and Valdre, U., 1981, J. Microsc. Spectrosc., 5, 175.
9. Pennycook, S. J., 1981, Ultramicroscopy, 7, 99.
10. Petroff, P. M., Logan, R. A., and Savage, A., 1980, Phys. Rev. Lett., 44, 287.
11. Rolland, P. A., Dalle, C., and Friscourt, M. R., 1991, IEEE Electron. Devices Lett., 12, 5.
12. Sparrow, T. G., and Valdre, U., 1977, Phil. Mag., 36, 1517.