A new sensor for the micrometre-level measurement of three-dimensional, dynamic contours

Measurement Science and Technology

Volumn 10, Issue 2, 1999, Pages 51-62

  Schmitz, Tony ^a   Ziegert, John ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

Dynamic contouring accuracy; Laser ball bar; Linear displacement interferometer; Simultaneous trilateration; Spatial coordinates

Indexed keywords

COMPUTER CONTROL; LASER APPLICATIONS; OPTICAL DEVICES; SENSORS; TESTING; THREE DIMENSIONAL;

SIMULTANEOUS TRILATERATION;

CONTOUR MEASUREMENT;

EID: 0033077908     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/2/001     Document Type: Article

References (10)

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