Bias correction for the maximum likelihood estimates in the two-parameter Weibull distribution

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 6, Issue 1, 1999, Pages 66-68

  Hirose, H ^a  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; MAXIMUM LIKELIHOOD ESTIMATION;

BIAS CORRECTION;

WEIBULL DISTRIBUTION;

EID: 0033077904     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.752011     Document Type: Article

References (8)

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2. A.C. Cohen, "Maximum likelihood Eslimation in the Weibull Distribution Based On Complete and On Censored Samples", Technometrics, Vol. 7, pp. 579-588, 1951.
3. A. C. Cohen, B. J. Whitten and Y. Ding, "Modified Moment Estimation for the Three-Parameter Lognormal Distribution", Journal of Quality Technology, Vol. 17 pp. 92-99, 1985.
4. M. Engelhardt and L. J. Bain, "Simplified Statistical Procedures for the Weibull or Extreme-value Distribution", Technometrics, Vol. 19, pp. 323-331, 1977.
5. J. Jacquelin, "Generalization of the Method of Maximum Likelihood", IEEE Transactions on Electrical Insulation, Vol. 28, pp. 65-72, 1993.
6. G. C. Montanari, G. Mazzanti, M. Cacciari and J. C. Fothergill, "Search of Convenient Techniques for Reducing Bias in the Estimation of Weibull Parameters for Uncensored Tests", IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 4, pp. 306-313, 1997.
7. R. Ross, "Formulas to Describe the Bias and Standard Deviation of the ML-estimated Weibull Shape Parameter", IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 1, pp. 247-253, 1994.
8. D. R. Thoman, L. J. Bain and C. E. Antle, "Inferences on the Parameters of the Weibull Distribution", Technometrics, Vol. 11, pp. 445-460, 1984.