Confocal and Scanning Probe Microscopy of Surface Modifications of Thin Polymer Films Induced by Infrared Diode Laser Irradiation

Langmuir

Volumn 15, Issue 4, 1999, Pages 1364-1372

  Catry, C ^a   Jeuris, K ^a   Jackers, C ^a   Hofkens, J ^a   Bastin, L ^a   Gensch, T ^a   Grim, P C M ^a   De Schryver, F C ^a   Van Damme, M ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPOLYMERS; DYES; MORPHOLOGY; POLYMETHYL METHACRYLATES; POLYSTYRENES; SEMICONDUCTOR LASERS; THIN FILMS;

CONFOCAL PROBE MICROSCOPY; INFRARED DIODE LASER IRRADIATION; SCANNING PROBE MICROSCOPY;

PLASTIC FILMS;

EID: 0033077882     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980867z     Document Type: Article

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