Feature Analysis Using Line Sweep Thinning Algorithm

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 21, Issue 2, 1999, Pages 145-158

  Chang, Fu ^a,b   Lu, Ya Ching ^a,c   Pavlidis, Theo ^a,d  

^a IEEE   (Taiwan)

^b INSTITUTE OF INFORMATION SCIENCE   (Taiwan)

^c Central Bank of China   (Taiwan)

^d Stony Brook University   (United States)

Author keywords

Character recognition; Feature analysis; Intersection set; Junction; Line sweep; Line sweep thinning algorithm; Path; Regular region; Singular region; Thinning

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CHARACTER RECOGNITION; EFFICIENCY; IMAGE PROCESSING;

INTERSECTION SET; LINE SWEEP; SINGULAR REGION; THINNING ALGORITHMS;

IMAGE RECONSTRUCTION;

EID: 0033076896     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.748823     Document Type: Article

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