Negatively charged subnanometer-sized silicon clusters and their reversible migration into AFI zeolite pores studied with X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy

Applied Surface Science

Volumn 140, Issue 1-2, 1999, Pages 126-137

  Choo, Cheow Keong ^a   Sakamoto, Takashi ^a   Tanaka, Katsumi ^a   Nakata, Ryouhei ^a   Asakawa, Tetsuo ^b  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b TOSOH CORPORATION   (Japan)

Author keywords

68.35. p; 73.20. r; 73.20.Dx; 82.80. d; Charge transfer; Cluster; Silicon; Ultraviolet photoelectron spectroscopy (UPS); X ray photoelectron spectroscopy (XPS); Zeolite

Indexed keywords

ELECTRONIC STRUCTURE; LASER ABLATION; POROSITY; SEMICONDUCTING SILICON; SILICON WAFERS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; ZEOLITES;

NANOCLUSTERS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0033076804     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00573-X     Document Type: Article

References (57)

1. Bloomfield L.A., Freeman R.R., Brown W.L. Phys. Rev. Lett. 54:1985;2246.
2. Raghavachari K., Logovinsky V. Phys. Rev. Lett. 55:1985;2853.
3. Begemann W., Meiwes-Broer K.H., Lutz H.O. Phys. Rev. Lett. 56:1986;2248.
4. Cheshnovsky O., Yang S.H., Pettiette C.L., Craycraft M.J., Liu Y., Smalley R.E. Chem. Phys. Lett. 138:1987;119.
5. Brown W.L., Freeman R.R., Raghavachari K., Schuluter M. Science. 235:1987;860.
6. Jarrold M.J., Bower J.E. J. Phys. Chem. 92:1988;5702.
7. Kitsopoulus T.N., Chick C.J., Weaver A., Newmark D.M. J. Chem. Phys. 93:1990;6108.
8. Raghavachari K., Rohlfing C.M. J. Chem. Phys. 94:1991;3670.
9. Rohlfing C.M., Raghavachari K. J. Chem. Phys. 96:1992;2114.
10. Arnold C.C., Neumark D.M. J. Chem. Phys. 99:1993;3353.
11. Honea E.C., Ogura A., Murray C.A., Raghavachari K., Sprenger W.O., Jarrold M.F., Brown W.L. Nature. 366:1993;42.
12. Fuke K., Tsukamoto K., Misaizu F., Sanekata M. J. Chem. Phys. 99:1993;7807.
13. Hayashi S., Kanazawa Y., Kataoka M., Nagarede T., Yamamoto K. Z. Phys. D. 26:1993;144.
14. Takagi H., Ogawa H., Yamazaki Y., Ishizaki A., Nakagiri T. Appl. Phys. Lett. 56:1990;2379.
15. Kanemitsu Y., Ogawa T., Shiraishi K., Takeda K. Phys. Rev. B. 58:1993;4883.
16. Tong S., Liu X.-N., Wang L.-C., Yan F., Bao X.-M. Appl. Phys. Lett. 69:1996;596.
17. Jarrold M.F. Science. 252:1991;1085.
18. Jarrold F.F., Ray U., Creegan K.M. J. Chem. Phys. 93:1990;224.
19. Gupta P., Mak C.H., Coon P.A., George S.M. Phys. Rev. 40:1989;7739.
20. Okada R., Iijima S. Appl. Phys. Lett. 58:1991;1662.
21. Demkov A.A., Sankey O.F. Phys. Rev. B. 56:1997;10497.
22. Begomolov V.N., Kholodkevich S.V., Romanov S.G., Agroskin L.S. Solid State Commun. 47:1983;181.
23. Wang Y., Herron N. J. Phys. Chem. 92:1988;4988.
24. MacDougall J.E., Eckert H., Stucky G.D., Herron N., Wang Y., Moller K., Bein T., Cox D. J. Am. Chem. Soc. 111:1989;8006.
25. Moller K., Bein T., Herron N., Mahler W., Wang Y. Inorg. Chem. 28:1989;2914.
26. Stucky G.D., MacDougall J.E. Science. 247:1990;669.
27. Wu C.-G., Bein T. Science. 264:1994;1757.
28. K. Tanaka, C.-K. Choo, T. Sakamoto, T. Asakawa, submitted.
29. S.T. Wilson, B.M. Lok, E.M. Flanigen, US Patent, (1982) 4,310,440.
30. Akazawa H., Utsumi Y., Urisu T., Nagase M. Phys. Rev. B. 47:1993;15946.
31. Akazawa H. Appl. Surf. Sci. 82-83:1994;394.
32. Himpsel F.J., McFeely F.R., Taleb-Ibrahimi A., Yamoff J.A., Hollinger G. Phys. Rev. B. 38:1988;6084.
33. Wagner C.D., Six H.A., Jansen W.T., Taylor J.A. Appl. Surf. Sci. 9:1981;203.
34. Seah M.P., Dench W.A. Surf. Interface Anal. 1:1979;2.
35. Howe R.F. J. Catal. 50:1977;196.
36. Fucul D.A., Brenner A. J. Am. Chem. Soc. 103:1981;217.
37. C.E. Moore, Atomic Energy Levels, NSRDS Natl. Stand. Ref. Data Ser. Natl. Bur. Stand., Circ No. 35 (U.S. GPO) Washington, DC, 1971.
38. Zhuang Q., Ishigoh K., Tanaka K., Kawano K., Nakata R. Jpn. J. Appl. Phys. 34:1995;L241.
39. Grunthaner F.J., Grunthaner P.J., Vasquez R.P., Lewis B.F., Maserjian J., Madhukar A. Phys. Rev. Lett. 43:1979;1683.
40. Nucho R.N., Madhukar A. Phys. Rev. B. 21:1980;1576.
41. Grunthaner F.J., Grunthaner P.J. Mater. Sci. Rep. 1:1986;65.
42. Plans J., Diaz G., Martinez E., Yudurain F. Phys. Rev. B. 35:1987;788.
43. Garner C.N., Lindau I., Sa C.Y., Pianetta P., Spicer W.E. Phys. Rev. B. 19:1979;3944.
44. Hollinger G. Appl. Surf. Sci. 8:1981;318.
45. Hollinger G., Himpsel F.J. Phys. Rev. B. 28:1983;3651.
46. Hollinger G., Himpsel F.J. J. Vac. Sci. Technol. A. 1:1983;640.
47. Hollinger G., Himpsel F.J. Appl. Phys. Lett. 44:1984;93.
48. Grunthaner P.J., Hecht M.H., Grunthaner F.J., Johnson N.M. J. Appl. Phys. 61:1987;629.
49. Bischoff J.L., Lutz F., Bolmont D., Kubler L. Surf. Sci. 251-252:1991;170.
50. Dufour G., Rochet F., Roulet H., Sirotti F. Surf. Sci. 304:1994;33.
51. Morar J.F., McFeely F.R., Shinn N.D., Landgren G., Himpsel F.J. Appl. Phys. Lett. 44:1984;174.
52. Kawamata H., Negishi Y., Kishi R., Iwata S., Nakajima A., Kaya K. J. Chem. Phys. 105:1996;5369.
53. Comtet G., Hellner L., Dujardin G., Ramage M.J. Surf. Sci. 352-354:1996;315.
54. Goldberg S.M., Fadley C.S., Kono S. J. Electron Spectrosc. Rel. Phen. 21:1981;285.
55. Copel M., Tromp R.M. Phys. Rev. Lett. 72:1994;1236.
56. Jackson D.C., Gallon T.E., Chambers A. Surf. Sci. 36:1973;381.
57. Kukla V., Kornatowski J., Demuth D., Girnus I., Pfeifer H., Rees L.V.C., Schunk S., Unger K.K., Kärger J. Science. 272:1996;702.