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Volumn 146, Issue 2, 1999, Pages 744-748
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Pattern Planarization Model of Chemical Mechanical Polishing
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL POLISHING;
KINEMATICS;
MATHEMATICAL MODELS;
CHEMICAL MECHANICAL POLISHING;
PATTERN PLANARIZATION MODEL;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0033076595
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1391674 Document Type: Article |
Times cited : (38)
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References (19)
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