Fractal Characterization of SERS-Active Electrodes Using Extended Focus Reflectance Microscopy

Applied Spectroscopy

Volumn 53, Issue 2, 1999, Pages 127-132

  Yamaguchi, Yoshinori ^a   Weldon, Millicent K ^a   Morris, Michael D ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Fractal dimension; Silicon substrate microelectrode; Silver electrode; Surface enhanced Raman spectroscopy (SERS)

Indexed keywords

FOCUSING; FRACTALS; LIGHT REFLECTION; MICROELECTRODES; OPTICAL MICROSCOPY; RAMAN SPECTROSCOPY; SILVER;

EXTENDED FOCUS REFLECTANCE MICROSCOPY; SURFACE-ENHANCED RAMAN SPECTROSCOPY (SERS);

ELECTROCHEMICAL ELECTRODES;

EID: 0033076433     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991946299     Document Type: Article

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