Analysis and automation of copper surface oxide measurement

Wire Journal International

Volumn 32, Issue 2, 1999, Pages 90-X

  Baker, Gil ^a   Pops, Horace ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; COMPUTER SOFTWARE; COPPER OXIDES; CURRENT DENSITY; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTROLYTES; FILMS; NITROGEN; OXYGEN; WIRE;

CATHODE REFERENCE ELECTRODE CONNECTION; COPPER SURFACE OXIDE MEASUREMENT; VOLTAGE DROP;

THICKNESS MEASUREMENT;

EID: 0033076227     PISSN: 02774275     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. W.E. Campbell and U.B. Thomas, "Tarnish Studies: Electrolytic Reduction Method for the Accurate Analysis of Thin Films on Metal Surfaces," Transactions of the Electrochemical Society, Vol. 76, 1939, pp 303-328.
2. H. Pops and D.R. Hennessy, "The Role of Surface Oxide and its Measurements in the Copper Wire Industry," Wire Journal International, March 1977, pp. 50-57.
3. S.J. Krumbein, B. Newell, and V. Pascucci, "Monitoring Environmental Tests by Coulometric Reduction of Metallic Control Samples," Journal of Testing and Evaluation, November 1989, pp. 357-367.
4. H.A. Miley, "Copper Oxide Films," Journal of the American Chemical Society, Vol. 59, July-December 1937, pp. 2626-2629.
5. A.T. Kuhn, M.S. Chana, and G.H. Kelsall, "Methods for the Analysis and Assessment of Tarnish," British Corrosion Journal, Vol. 18, No. 4, 1983, pp. 174-178.
6. H. Pops, "Measurement of Oxide and Sulfide Films on Copper Rod and Wire," Nonferrous Wire Handbook, Volume 3: Principles and Practice, The Wire Association International, Inc., Guilford, Connecticut, 1995, pp. 564-570.
7. P. C. S. Hayfield, "Ellipsometry as an aid in Studying Metallic Corrosion Problems," Surface Science, Vol. 56, 1976, pp. 488-507.