Interface configuration in gold/polycarbonate bilayer structure: An in situ study through Ar + ion depth profiling

Applied Surface Science

Volumn 140, Issue 1-2, 1999, Pages 197-203

  Patnaik, Archita ^a,b   Li, Changlin ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b INSTITUTE OF MODERN PHYSICS   (China)

Author keywords

Ar + ion depth profiling; Gold polycarbonate bilayer structure; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ARGON; GOLD; INTERFACES (MATERIALS); IONS; POLYCARBONATES; X RAY PHOTOELECTRON SPECTROSCOPY;

BILAYERS; ION DEPTH PROFILING;

MONOLAYERS;

EID: 0033075494     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00591-1     Document Type: Article

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