Characterization of electrostatically self-assembled nanocomposite thin films

Smart Materials and Structures

Volumn 8, Issue 1, 1999, Pages 100-105

  Liu, Yanjing ^a   Rosidian, Aprillya ^b   Lenahan, Kristie ^b   Wang, You Xiong ^b   Zeng, Tingying ^b   Claus, Richard O ^b  

^a NANOSONIC INC   (United States)

^b State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTROSTATICS; ELLIPSOMETRY; MULTILAYERS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET SPECTROSCOPY;

ELECTRONIC SELF-ASSEMBLED MONOLAYERS; METALLIC NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

EID: 0033075422     PISSN: 09641726     EISSN: None     Source Type: Journal    
DOI: 10.1088/0964-1726/8/1/011     Document Type: Article

References (13)

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11. Rosidian A, Wang Y-X, Liu Y and Claus R Ultrahard metal oxide nanoparticle thin-film coatings Adv. Mater. at press
12. Zeng T, Liu Y and Claus R unpublished
13. Liu Y, Claus R, Wang Y-X and Lenahan K 1998 Electrostatic self-assembled high conductivity metal nanoparticle-based thin films MRS Fall Meeting (Boston, 1998)