Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

IEEE Transactions on Nuclear Science

Volumn 46, Issue 1, 1999, Pages 59-69

  Zajic, Vladimir ^a   Thieberger, Peter ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Heavy ion beam; Linear energy transfer (let); Plastic scintillator; Pulse height defect (phd); Single event upset (seu)

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT; HEAVY IONS; HIGH ENERGY PHYSICS; SCINTILLATION COUNTERS;

BEAM DIAGNOSTIC SYSTEM; LINEAR ENERGY TRANSFER; PLASTIC SCINTILLATOR;

ION BEAMS;

EID: 0033075092     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.747768     Document Type: Article

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