Study of high resolution TEM images of nanoparticles either supported on amorphous films or embedded in a crystalline matrix

Materials Transactions, JIM

Volumn 40, Issue 2, 1999, Pages 141-145

  Yacaman, M Jose ^a   Zorrilla, C ^a   Ascencio, J A ^a   Mondragon, G ^a   Reyes Gasga, J ^a  

^a INSTITUTO NACIONAL DE INVESTIGACIONES NUCLEARES   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COMPUTER SIMULATION; CRYSTAL STRUCTURE; PARTICLE SIZE ANALYSIS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE MATRIX; MOIRE PATTERNS; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 0033075087     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.40.141     Document Type: Article

References (15)