Optical heterodyne detection at a silver scanning tunneling microscope junction

Journal of Applied Physics

Volumn 85, Issue 3, 1999, Pages 1311-1316

  Kokubo, T ^a,b   Gallagher, Alan ^a   Hall, J L ^a  

^a UNIVERSITY OF COLORADO   (United States)

^b JSR CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC POTENTIAL; ELECTRON TUNNELING; FERMI LEVEL; LASER BEAMS; MICROSCOPES; RAMAN SPECTROSCOPY; RESONANCE; THERMAL EXPANSION;

METAL INSULATOR METAL JUNCTIONS; OPTICAL HETERODYNE DETECTION; PLASMON RESONANCE; SURFACE ENHANCED RAMAN SPECTROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 0033072589     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369332     Document Type: Article

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