Electron energy loss spectroscopy and energy filtered imaging of Xe cavities embedded in Al at 423 and 473 K

Micron

Volumn 30, Issue 2, 1999, Pages 129-133

  Song, M ^a   Mitsuishi, K ^a   Furuya, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron energy loss spectroscopy; Energy filtered imaging; Implantation; Precipitates; Xe

Indexed keywords

EID: 0033060819     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00015-3     Document Type: Conference Paper

References (12)

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